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Advances in Imaging and Electron Physics
1st Edition, Volume 191 - August 21, 2015
Editor: Peter W. Hawkes
Language: English
Hardback ISBN:9780128022535
9 7 8 - 0 - 1 2 - 8 0 2 2 5 3 - 5
eBook ISBN:9780128025192
9 7 8 - 0 - 1 2 - 8 0 2 5 1 9 - 2
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy…Read more
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merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on all the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Preface
Future Contributions
Chapter One: Femtosecond Electron Imaging and Spectroscopy: Proceedings of the Conference on Femtosecond Electron Imaging and Spectroscopy, FEIS 2013, December 9–12, 2013, Key West, FL, USA
Abstract
1 Introduction
References
Session 1: Current Status of Ultrafast Imaging and Spectroscopy
Session 2: Emerging Opportunities
Session 3: High-Brightness Technologies for the Next Generation Ultrafast Electron Microscopes
Session 4: Beam Dynamics and Optics
Session 5: Synergistic Development and Further Discussion
Chapter Two: Imaging with Electrons, X-rays, and Microwaves: Some Scattered Thoughts
Abstract
1 Overview of Career; Influences on Research Selection
2 From Elmiscope to STEM: Imaging with electrons
3 Binary Optical Filters for Bright-Field Electron Microscopy
4 Electron Scattering and Fourier Phase Retrieval
5 Imaging by X-rays
6 Imaging by Synthetic Aperture Radar
7 Final Comments
Contents of Volumes 151-190
Index
No. of pages: 342
Language: English
Edition: 1
Volume: 191
Published: August 21, 2015
Imprint: Academic Press
Hardback ISBN: 9780128022535
eBook ISBN: 9780128025192
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
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