Pattern Recognition

Editor-in-Chief Ching Y. Suen Dept. of Computer Science & Software Engineering, CENPARMI, Building EV, Concordia University, Suite 3-105, 1455 de Maisonneuve Blvd West, Montréal, QC H3G 1M8, Canada, Founding Editor Robert S. Ledley Bethesda, MD, USA, Advisory Editors Roland Chin Hong Kong University of Science & Technology, Hong Kong, China, Maria Petrou Imperial College London, Kensington, London, UK, Linda Shapiro University of Washington, Seattle, WA, USA, Area Editors Zoran Duric George Mason University, Fairfax, VA, USA, Edwin Hancock University of York, York, UK, Seong-Whan Lee Korea University, Seoul, South Korea, Editorial Board Members Mohamed Abdel-Mottaleb University of Miami, Coral Gables, FL, USA, Majid Ahmadi University of Windsor, Windsor, ON, Canada, Mitra Basu City College of the City University of NY, New York, NY, USA, Bir Bhanu University of California at Riverside, Riverside, CA, USA, Prabir Bhattacharya University of Cincinnati, Cincinnati, OH, USA, Horst Bischof Institute for Computer Graphics & Vision, Graz, Austria, Djamel Bouchaffra West Monroe, LA, USA, Lisa Brown IBM Thomas J. Watson Research Center, Hawthorne, NY, USA, Alfred Bruckstein Technion - Israel Institute of Technology, Haifa, Israel, Chi H. Chen University of Massachusetts Dartmouth, N. Dartmouth, MA, USA, Heng-Da Cheng Utah State University, Logan, UT, USA, Mohamed Cheriet Université du Quebec à Montreal (UQAM), Montreal, QC, Canada, Atam Dhawan New Jersey Institute of Technology, Newark, NJ, USA, Mahmoud El-Sakka University of Western Ontario, London, ON, Canada, Bilge Gunsel Istanbul Technical University, Istanbul, Turkey, Laurent Heutte Université de Rouen, Saint-Etienne-du-Rouvray, France, Jianying Hu IBM Thomas J. Watson Research Center, Hawthorne, NY, USA, Atsushi Imiya Chiba University, Chiba, Japan, Robert Jenssen University of Tromsø, Tromsø, Norway, Xiaoyi Jiang Goethe-Universität Frankfurt, Frankfurt 1, Germany, Jean-Michel Jolion INSA de Lyon, Villeurbanne, France, Mohamed Kamel University of Waterloo, Waterloo, ON, Canada, Adam Krzyzak Concordia University, Québec, QC, Canada, Louisa Lam Concordia University, Montréal, QC, Canada, Longin Jan Latecki Temple University, Philadelphia, PA, USA, Charles Graham Leedham University of New England, Armidale, NSW, Australia, Aleš Leonardis University of Ljubljana, Ljubljana, Slovenia, Xuelong Li Birkbeck College, University of London, London, England, UK, Cheng-Lin Liu Chinese Academy of Sciences (CAS), Beijing, China, Marco Loog Technische Universiteit Delft, Delft, Netherlands, Jiebo Luo Eastman Kodak Company, Rochester, NY, USA, Takeshi Masuda Japan Advanced Institute of Science and Technology, Ishikawa, Japan, Babu Mehtre Visual Inform. Systems Group, Andhra Pradesh, India, Vittorio Murino Università degli Studi di Verona, Verona, Italy, Yi Lu Murphey University of Michigan at Dearborn, Dearborn, MI, USA, Fionn Murtagh University of London, Egham, UK, Marcello Pelillo Università Ca'Foscari Venezia, Venezia Mestre, Italy, Tuan Pham University of New South Wales, Canberra, ACT, Australia, Antonio Robles-Kelly National ICT Australia (NICTA), Canberra, ACT, Australia, Raimondo Schettini Università degli Studi di Milano, Milano, Italy, Dinggang Shen University of North Carolina at Chapel Hill, Chapel Hill, NC, USA, Frank Shih New Jersey Institute of Technology, Newark, NJ, USA, Ponnuthurai Suganthan Nanyang Technological University, Singapore, Boaz Super Motorola Inc., Schaumburg IL, USA, Remco Veltkamp Universiteit Utrecht, Utrecht, Netherlands, Nicole Vincent Université Paris Descartes, Paris, France, Richard Wilson University of York, York, UK, Herb Yang University of Alberta, Edmonton, AB, Canada, Dit-Yan Yeung Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong, Jane Jia You The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, Pong Chi Yuen Hong Kong Baptist University, Kowloon, Hong Kong, China, Changshui Zhang Tsinghua University, Beijing, China, Jie Zhou Northern Illinois University, DeKalb, IL, USA