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Pattern Recognition Letters
 
 

Pattern Recognition Letters

An official publication of the International Association for Pattern Recognition

 
 

Journal

 1.062(2013)

1.529

Editors-in-Chief:G. Borgefors

Show

01678655

51-66

16

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Aims & Scope

Pattern Recognition Letters aims at rapid publication of concise articles of a broad interest in pattern recognition.
Subject areas include all the current fields of interest represented by the Technical Committees of the International Association of Pattern Recognition, and other developing themes involving learning and recognition. Examples include:

• Statistical, structural, syntactic pattern recognition;
• Neural networks, machine learning, data mining;
• Discrete geometry, algebraic, graph-based techniques for pattern recognition;
• Signal analysis, image coding and processing, shape and texture analysis;
• Computer vision, robotics, remote sensing;
• Document processing, text and graphics recognition, digital libraries;
• Speech recognition, music analysis, multimedia systems;
• Natural language analysis, information retrieval;
• Biometrics, biomedical pattern analysis and information systems;
• Scientific, engineering, social and economical applications of pattern recognition;
• Special hardware architectures, software packages for pattern recognition.

We invite contributions as research reports or commentaries.

Research reports should be concise summaries of methodological inventions and findings, with strong potential of wide applications.
Alternatively, they can describe significant and novel applications of an established technique that are of high reference value to the same application area and other similar areas.

Commentaries can be lecture notes, subject reviews, reports on a conference, or debates on critical issues that are of wide interests.

To serve the interests of a diverse readership, the introduction should provide a concise summary of the background of the work in an accepted terminology in pattern recognition, state the unique contributions, and discuss broader impacts of the work outside the immediate subject area. All contributions are reviewed on the basis of scientific merits and breadth of potential interests.

Audience

Researchers and practitioners in Pattern Recognition, Computer Science, Electrical and Electronic Engineering, Mathematics and Statisticians, and any areas of science and engineering where automatic pattern recognition is applicable.

Abstracting and Indexing

ACM Computing Reviews, Cambridge Scientific Abstracts, CompuScience, Computer Abstracts, Current Contents/Engineering, Computing & Technology, Engineering Index, Geographical Abstracts, INSPEC Information Services, SCISEARCH, Science Citation Index, Scopus, Zentralblatt MATH
Editors-in-Chief G. Borgefors Uppsala University, Uppsala, Sweden, G. Sanniti di Baja National Research Council of Italy (CNR), Pozzuoli, Napoli, Italy, S. Sarkar University of South Florida, Tampa, FL, USA, Area Editors D. Coeurjolly Université de Lyon, Lyon, France, E.R. Davies University of London, Holloway, Egham, UK, M.A. Girolami University College London (UCL), London, UK, C. L. Luengo Hendriks Uppsala Universitet, Uppsala, Sweden, Mark S. Nixon University of Southampton, Southampton, England, UK, Associate Editors S. Aksoy Bilkent University, Bilkent, Ankara, Turkey, O. Bellon IMAGO Research Group, Curitiba/PR, Brazil, Y. Chang yahoo! Labs - Sunnyvale, Sunnyvale, CA, USA, N. Chawla University of Notre Dame, Notre Dame, IN, USA, M. Couprie Groupe ESIEE Paris, Noisy le Grand, France, D. Dembélé Institut de Génétique et de Biologie Moléculaire et Cellulaire (IGBMC), Illkirch Cedex, France, S. Dutta Roy Indian Institute of Technology, Mumbai, India, A. Fernández-Caballero Universidad de Castilla La Mancha, Albacete, Spain, L. Heutte Université de Rouen, Saint-Etienne-du-Rouvray, France, A. Heyden , J.K. Kamarainen Lappeenranta University of Technology, Lappeenranta, Finland, M. Kamel University of Waterloo, Waterloo, ON, Canada, F. Kimura Mie University, Kamihama, Japan, A. Koleshnikov University of Eastern Finland, Joensuu, Finland, V. Kovalev National Academy of Sciences of Belarus (NASB), Minsk, Belarus, A. Kumar The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, J. Laaksonen Aalto University and Lappeenranta University of Technology, Aalto, Finland, Y. Liu Aberystwyth University, Aberystwyth, UK, C. L. Luengo Hendriks Uppsala Universitet, Uppsala, Sweden, A. Marcelli Università degli Studi di Salerno, Fisciano, Italy, E. Michaelsen Fraunhofer (IOSB), Ettlingen, Germany, G. Moser Università degli Studi di Genova, Genova, Italy, M. Nappi Università degli Studi di Salerno, Fisciano, Italy, B. Ommer Ruprecht-Karls-Universität Heidelberg, Heidelberg, Germany, A. Petrosino Università di Napoli "Parthenope", Napoli, Italy, H. Sako Hosei University, Tokyo, Japan, A. Shokoufandeh Drexel University, Philadelphia, PA, USA, N. Sladoje University of Novi Sad, Novi Sad, Serbia, M. Tistarelli Università degli Studi di Sassari, Alghero, Italy, S. Todorovic Oregon State University, Corvallis, OR, USA, K.A. Toh Yonsei University, Seodaemun-Gu, Seoul, South Korea, A. Torsello Università Ca'Foscari Venezia, Venezia Mestre, Italy, F Tortorella University of Cassino, Cassino (FR), Italy, S. Wang University of South Carolina, Columbia, SC, USA, J. Yang Nanjing University of Science and Technology, Nanjing, China, L. Yin State University of New York (SUNY) at Binghamton, Binghamton, NY, USA, J Zou National Library of Medicine (NLM), Bethesda, MD, USA, Advisory Editors S. Dickinson University of Toronto, Toronto, ON, ON, Canada, R.P.W. Duin Delft University of Technology, Delft, Netherlands, A.K. Jain Michigan State University, East Lansing, MI, USA, J.V. Kittler University of Surrey, Guildford, Surrey, UK, W.G. Kropatsch Technische Universität Wien, Wien, Austria, C.Y. Suen Concordia University, Montréal, QC, Canada, T. Tan National Laboratory of Pattern Recognition, Beijing, China, Founding Editors E. Backer , E.S. Gelsema , Editor Emerita T.K. Ho Alcatel-Lucent, Murray Hill, NJ, USA
 
 
 
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