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https://doi.org/10.1016/j.microrel.2024.115378
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https://doi.org/10.1016/j.microrel.2024.115347
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https://doi.org/10.1016/j.microrel.2024.115355
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https://doi.org/10.1016/j.microrel.2024.115356
Research articleAbstract onlyApril 2024
https://doi.org/10.1016/j.microrel.2024.115357
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https://doi.org/10.1016/j.microrel.2024.115359
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https://doi.org/10.1016/j.microrel.2024.115360
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Calls for papers
Reliability and Failure Physics: selected papers from the ESREF 2024 Conference
Guest editors: Francesco Iannuzzo, Giovanna Mura, Paolo Cova - Submission deadline: 15 November 2024
This special issue of Microelectronics and Reliability comprises a selection of papers presented during the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2024, at Parma (Italy) from September 23rd …
Submission deadline: 15 November 2024
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Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023
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Print ISSN: 0026-2714
Online ISSN: 1872-941X
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