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Thin Films for Advanced Electronic Devices
Advances in Research and Development
1st Edition, Volume 15 - February 26, 1991
Editors: Maurice H. Francombe, John L. Vossen
Language: English
eBook ISBN:9781483288901
9 7 8 - 1 - 4 8 3 2 - 8 8 9 0 - 1
In this volume of the highly esteemed Physics of Thin Films serial, focused coverage is given to new trends in solid state devices. Four chapters combine to provide comprehensive…Read more
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In this volume of the highly esteemed Physics of Thin Films serial, focused coverage is given to new trends in solid state devices. Four chapters combine to provide comprehensive discussions of magnetostatic wave phenomena in epitaxial magnetic oxide films and their applications in microwave signal processing devices: Thin-film rare earth transition metal alloys for magnetooptic recording. Two new classes of quantum well structures that have been used for infrared detectors and ultrafast resonant tunneling devices. Recent applications of Fourier transform spectroscopy for the analysis of inorganic thin solid films. This book provides a focused treatment of recent developments in novel thin film solid state components, and specifically discusses magnetic, semiconducting, and optical phenomena.
Researchers, students, and engineers concerned with electronic materials and devices, thin film physics, and materials science.
J.D. Adam, M.R. Daniel, P. Emtage, and S.H. Talisa, Magnetostatic Waves. B.S. Krusor and G.A.N. Connell, Thin-Film Rare Earth-Transition Metal Alloys for Magneto-Optic Recording. D.D. Coon and K.M.S.V. Bandara, New Quantum Structures. D.M. Back, Fourier Transform Infrared Analysis of Thin Films.
No. of pages: 336
Language: English
Edition: 1
Volume: 15
Published: February 26, 1991
Imprint: Academic Press
eBook ISBN: 9781483288901
MF
Maurice H. Francombe
Affiliations and expertise
Georgia State University, Atlanta, U.S.A.
JV
John L. Vossen
Affiliations and expertise
RCA Laboratories, Princeton, New Jersey
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