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Principles of Semiconductor Network Testing
 
 

Principles of Semiconductor Network Testing, 1st Edition

 
Principles of Semiconductor Network Testing, 1st Edition,Amir Afshar,ISBN9780750694728
 
 
 

  

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9780750694728

9780080539560

350

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Key Features

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers.
Best new source of information for experienced semiconductor engineers as well as entry-level personnel.
Eight chapters about semiconductor testing.

Description

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Readership

Semiconductor design & test engineers

Amir Afshar

Affiliations and Expertise

National Semiconductor

Principles of Semiconductor Network Testing, 1st Edition

Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References
 
 

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