Identification of Defects in Semiconductors

Identification of Defects in Semiconductors, 1st Edition

Identification of Defects in Semiconductors, 1st Edition,R. K. Willardson,Eicke Weber,Michael Stavola,ISBN9780127521596

Semiconductors and Semimetals

Willardson   &   Weber   &   Stavola   

Academic Press




229 X 152

Print Book + eBook

USD 306.00
USD 510.00

Buy both together and save 40%

Print Book


In Stock

Estimated Delivery Time
USD 260.00

eBook Overview

VST (VitalSource Bookshelf) format

DRM-free included formats : PDF

USD 250.00
Add to Cart


Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.


Researchers, graduate students and practitioners in materials science (electronic materials field), and electrical engineering (field of electronic devices).

R. K. Willardson

Affiliations and Expertise


Eicke Weber

Affiliations and Expertise

Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany

View additional works by Eicke R. Weber

Michael Stavola

Affiliations and Expertise

Lehigh University, Bethlehem, Pennsylvania

Identification of Defects in Semiconductors, 1st Edition

List of Contributors. Preface. G.D. Watkins, EPR and ENDOR Studies of Defects in Semiconductors. J.M. Spaeth, Magneto-optical and Electrical Detection of Paramagnetic Resonance in Semiconductors. T.A. Kennedy and E.R. Glaser, Magnetic Resonance of Epitaxial Layers Detected by Photoluminescence. K.H. Chow, B.Hitti and R.F. Kiefl, uSR on Muonium in Semiconductors and its Relation to Hydrogen. K.Saarinen, P.Hautojarvi, and C. Corbel, Positron Annihilation Sprectroscopy of Defects in Semiconductors. R. Jones and P.R. Briddon, The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors. Subject Index. Contents of Volumes in This Series.
Free Shipping
Shop with Confidence

Free Shipping around the world
▪ Broad range of products
▪ 30 days return policy

Contact Us