Digital Circuit Testing, 1st Edition

A Guide to DFT and Other Techniques

 
Digital Circuit Testing, 1st Edition,Francis Wong,ISBN9780127345802
 
 
 

  

Academic Press

9780127345802

9780080504346

228

235 X 159

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Description

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Readership

Professional engineers involved in designing, testing, and manufacturing digital integrated circuits and printed circuit boards.

Francis Wong

Affiliations and Expertise

Seattle University, Washington

Digital Circuit Testing, 1st Edition

A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.

Quotes and reviews

@qu:"The text, Digital Circuit Testing: A Guide to DFT and Other Techniques, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style."
@source:--IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER
 
 
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