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Advances in Imaging and Electron Physics
 
 

Advances in Imaging and Electron Physics, 1st Edition

 
Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780124081420
 
 
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Advances in Imaging and Electron Physics

P Hawkes   

Academic Press

9780124081420

270

229 X 152

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

Print Book

Hardcover

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USD 183.75
USD 245.00
 
 

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Peter Hawkes

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the European and International congresses on (electron) microscopy. He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France

View additional works by Peter W. Hawkes

Advances in Imaging and Electron Physics, 1st Edition

Series Page

Preface

Future Contributions

Foreword

Contributors

Chapter One. Early History of Wien Filters

1 Wilhelm Wien and his Wien Filter

2 Up to 1950s: Applications to a Part of Mass Analyzers

3 After the 1960s: The First Application to Electrons

4 A Brief History of the Theory of Wien Filters

5 About This Book

Chapter Two. Aberration Theory of the Wien Filter

1 Preliminary Remarks

2 Zeroth-Order Wien Filter

3 Stigmatic Wien Filters

4 Homogeneous Fields Wien Filters

5 First-order Wien Filters

6 Relativistic Charged Particle Paths in Wien Filters

Chapter Three. Wien Filter Instrumentation

1 Iron-free Coils

2 Generation of Quadrupole Fields

3 Double-Focus Wien Filter

4 Comments on the Wien Condition

5 Effect of Retarding Field

Chapter Four. Simulation of Multipole Wien Filters

1 Multipole Wien Filters

2 Previous Simulation Work on Multipole Wien Filters

3 Estimation of Voltages and Ampere-Turns

4 Simulation of an Equal-Arch, 8-Pole Wien Filter

5 Simulation of Equal-Arch, 12-Pole Wien Filter

6 Simulation of Different-Arch, 8-pole Wien Filter

7 A Different-Arch, 12-pole Wien filter

Chapter Five. Wien Filter Applications to Ions

1 Wien Filters as Independent Mass Analyzers

2 Double-Focusing Mass Spectrometers

3 Wien Filter in Accelerator Mass Spectrometry

4 Micro Wien Filters as Leak Detectors

5 Wien Filters for Radioactive Ions

6 Reaction Product Separators

7 Multiple Wien Filters

Chapter Six. Application of Wien Filters to Electrons

1 Monochromators and Analyzers

2 Beam Separator

3 Wien Spin Rotator

4 Wien Electron Phase Shifter

5 Wien Aberration Corrector

6 Wien Filter Without Dipoles

References

Index

Contents of Volumes 151-175

Color Plates

 
 
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