Volume 175: Advances in Imaging and Electron Physics, 1st Edition

Key Features

Key features:

* Contributions from leading authorities
* Informs and updates on all the latest developments in the field

Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Advances in Imaging and Electron Physics, 1st Edition

1. Small Angle Scatter with Correlation, Scatter and Intermediate Functions

Jay Theodore Cremer, Jr.

2. Nuclear Scatter of Neutron Spin States

Jay Theodore Cremer, Jr.

3. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope

Christian Dwyer

4. Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques

Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carré

5. Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy

Partha Pratim Mondal and Alberto Diaspro

6. Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations