Key Features
Key features:
* Contributions from leading authorities
* Informs and updates on all the latest developments in the field
Description
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Readership
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
