Volume 170: Advances in Imaging and Electron Physics, 1st Edition

Key Features

Key features:

* Contributions from leading authorities
* Informs and updates on all the latest developments in the field

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Advances in Imaging and Electron Physics, 1st Edition

1. Precession Electron Diffraction
   A. S. Eggeman and P. A. Midgley
2. Scanning Helium Ion Microscopy
   R. Hill, J. A. Notte, and L. Scipioni
3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain
   Hone-Ene Hwang, Pin Han
4. Electron Microscopy Studies on Magnetic L1₀ FePd Nanoparticles
   Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy
   D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis