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Advances in Imaging and Electron Physics
 
 

Advances in Imaging and Electron Physics, 1st Edition

 
Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780123943965
 
 
 

Advances in Imaging and Electron Physics

P Hawkes   

Academic Press

9780123943965

9780123978431

280

229 X 152

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Key Features

Key features:

* Contributions from leading authorities
* Informs and updates on all the latest developments in the field


Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Peter Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

Affiliations and Expertise

CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

View additional works by Peter W. Hawkes

Advances in Imaging and Electron Physics, 1st Edition

  1. Precession Electron Diffraction
    A. S. Eggeman and P. A. Midgley
  2. Scanning Helium Ion Microscopy
    R. Hill, J. A. Notte, and L. Scipioni
  3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain
    Hone-Ene Hwang, Pin Han
  4. Electron Microscopy Studies on Magnetic L10 FePd Nanoparticles
    Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
  5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy
    D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis
 
 

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