Volume 168: Advances in Imaging and Electron Physics, 1st Edition

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Advances in Imaging and Electron Physics, 1st Edition

1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach

LucaGeretti, AntonioAbramo

2. Logarithmic Image Processing for Color Images

M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography

Rainer A. Leitgeb

4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy

S.A. Nepijko, G. Schönhense

5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging

Chad M. Parish

6. Aberration Correctors developed under Triple C Project

Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

7. Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher