Volume 161: Advances in Imaging and Electron Physics, 1st Edition

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Advances in Imaging and Electron Physics, 1st Edition

1. Charged particles in electromagnetic fields

2. Language of aberration expansions in charged particle optics

3. Transporting charged particle beams in static fields

4. Transporting charged particles in radiofrequency fields

5. Static magnetic charged particle analyzers

6. Electrostatic energy analyzers

7. Mass analyzers with combined electrostatic and magnetic fields

8. Time-of-flight mass analyzers

9. Radiofrequency mass analyzers