»
»
Theory of intense beams of charged particles
 
 

Theory of intense beams of charged particles, 1st Edition

 
Theory of intense beams of charged particles, 1st Edition,Peter Hawkes,ISBN9780123813107
 
 
 

Advances in Imaging and Electron Physics

P Hawkes   

Academic Press

9780123813107

9780123813114

752

229 X 152

Print Book + eBook

USD 298.80
USD 498.00

Buy both together and save 40%

Print Book

Hardcover

In Stock

Estimated Delivery Time
USD 260.00

eBook
eBook Overview

VST format:

DRM Free included formats: PDF

USD 238.00
Add to Cart
 
 

Key Features

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Peter Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

Affiliations and Expertise

CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

View additional works by Peter W. Hawkes

Theory of intense beams of charged particles, 1st Edition

  1. Beam equations
  2. Exact solutions to the beam equations
  3. Anti-paraxial expansions
  4. Solution of the beam formation problem in 3D case
  5. Asymptotic theory of 3D flows
  6. Geometrized theory
  7. Examples of applications
 
 
Free Shipping
NOTE: We are upgrading our eBook operations; please allow up to 1-2 days for delivery of your eBook order.