»
»
Advances in Imaging and Electron Physics
 
 

Advances in Imaging and Electron Physics, 1st Edition

Aberration-corrected Electron Microscopy

 
Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780123742209
 
 
 

Advances in Imaging and Electron Physics

P Hawkes   

Academic Press

9780123742209

9780080880358

590

229 X 152

Print Book + eBook

USD 321.00
USD 535.00

Buy both together and save 40%

Print Book

Hardcover

In Stock

Estimated Delivery Time
USD 275.00

eBook
eBook Overview

VST (VitalSource Bookshelf) format

DRM-free included formats : EPUB, Mobi (for Kindle), PDF

USD 260.00
Add to Cart
 
 

Key Features

* First book on the subject of correctors
* Well known contributors from academia and microscope manufacturers
* Provides an ideal starting point for preparing funding proposals

Description

The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth.

Readership

All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Peter Hawkes

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the European and International congresses on (electron) microscopy. He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France

View additional works by Peter W. Hawkes

Advances in Imaging and Electron Physics, 1st Edition

History of aberration correction in electron microscopy (H. Rose)
Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider)
Aberration correction and STEM (O.L. Krivanek)
First results using the Nion third order STEM corrector (P. Batson)
STEM and EELS: Mapping materials atom by atom (A.B. Bleloch)
Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (M. Hÿtch, F. Hüe, E. Snoeck and F. Houdellier)
Novel aberration corrections concepts (B. Kabius)
Aberration corrected imaging in CTEM and STEM (A. Kirkland, P.D. Nellist, Lan-Yun Chang and S.J. Haigh)
Materials applications of aberration-corrected STEM (S.J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, K. van Benthem, A. Y. Borisevich, M. P. Oxley, W. Luo and S. T. Pantelides)
Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka)
Aberration correction in practice (K. Urban and J. Mayer)
Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)
 
 
Free Shipping
Shop with Confidence

Free Shipping around the world
▪ Broad range of products
▪ 30 days return policy
FAQ

Contact Us