VLSI Test Principles and Architectures, 1st Edition

Design for Testability

VLSI Test Principles and Architectures, 1st Edition,Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen,ISBN9780123705976

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Morgan Kaufmann




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The most up-to-date coverage available of VLSI Testing and Design-for-Testability!

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Key Features

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.


This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.


PRIMARY: Practitioners/Researchers in VLSI Design and Testing; Design or Test Engineers, as well as research institutes.

SECONDARY: Undergraduate and graduate-level courses in Electronic Testing, Digital Systems Testing, Digital Logic Test & Simulation, and VLSI Design.

Laung-Terng Wang

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Affiliations and Expertise

SynTest Technologies, Inc., Sunnyvale, CA, USA

View additional works by Laung-Terng Wang

Cheng-Wen Wu

Affiliations and Expertise

National Tsing Hua University, Hsinchu, Taiwan.

Xiaoqing Wen

Affiliations and Expertise

Kyushu Institute of Technology, Fukuoka, Japan.

VLSI Test Principles and Architectures, 1st Edition

Chapter 1 – Introduction
Chapter 2 – Design for Testability
Chapter 3 – Logic and Fault Simulation
Chapter 4 – Test Generation
Chapter 5 – Logic Built-In Self-Test
Chapter 6 – Test Compression
Chapter 7 – Logic Diagnosis
Chapter 8 – Memory Testing and Built-In Self-Test
Chapter 9 – Memory Diagnosis and Built-In Self-Repair
Chapter 10 – Boundary Scan and Core-Based Testing
Chapter 11 – Analog and Mixed-Signal Testing
Chapter 12 – Test Technology Trends in the Nanometer Age

Quotes and reviews

In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.

Michel Renovell, Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France

This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.

Hans-Joachim Wunderlich, University of Stuttgart, Germany

Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs.

Andre Ivanov, University of British Columbia, Canada

This is the most recent book covering all aspects of digital systems testing. It is a “must read” for anyone focused on learning modern test issues, test research, and test practices.

Kewal K. Saluja, University of Wisconsin-Madison

By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills.

Yihe Sun, Tsinghua University, Beijing, China
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