Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780080458557
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Volume 136: Advances in Imaging and Electron Physics, 1st Edition

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Imprint: Academic Press

ISBN: 9780080458557

Pages: 352

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Description

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Peter Hawkes

Affiliations and Expertise

CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

View additional works by Peter W. Hawkes

Advances in Imaging and Electron Physics, 1st Edition

Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI);

Chapter 2 - The S - State Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK);

Chapter 3 - Measurement of Electric Fields on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)
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Advances in Imaging and Electron Physics