Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780120147762
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Multi-Volume: Advances in Imaging and Electron Physics

Volume 134: Advances in Imaging and Electron Physics, 1st Edition

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Imprint: Academic Press

ISBN: 9780120147762

Pages: 296

Dimensions: 229 X 152

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Description

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Peter Hawkes

Affiliations and Expertise

CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

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Advances in Imaging and Electron Physics, 1st Edition

Chapter 1 - Circulant matrix representation of feature masks and its applications (PARK and CHA);

Chapter 2 - Phase problem and reference beam diffraction (SHEN);

Chapter 3 - Fractal encoding (VITULANO)

Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)
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Advances in Imaging and Electron Physics
 

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Advances in Imaging and Electron Physics, 1st Edition

Print Book:
USD 245.00 USD 122.50
Editor: Peter Hawkes
Release Date: 31 May 2006