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Advances in Imaging and Electron Physics
 
 

Advances in Imaging and Electron Physics, 1st Edition

 
Advances in Imaging and Electron Physics, 1st Edition,Peter Hawkes,ISBN9780120147694
 
 
 

Advances in Imaging and Electron Physics

P Hawkes   

Academic Press

9780120147694

9780080490076

407

229 X 152

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Key Features

· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.

Description

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Readership

Researchers, academics, physicists and engineers working in the field of image and electron physics

Peter Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

Affiliations and Expertise

CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

View additional works by Peter W. Hawkes

Advances in Imaging and Electron Physics, 1st Edition

Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.
 
 
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