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Modern Map Methods in Particle Beam Physics
 
 

Modern Map Methods in Particle Beam Physics, 1st Edition

 
Modern Map Methods in Particle Beam Physics, 1st Edition,Martin Berz,Kyoko Makino,Khodr Shamseddine,Weishi Wan,ISBN9780120147502
 
 
 

Advances in Imaging and Electron Physics

Berz   &   Makino   &   Shamseddine   &   Wan   

Academic Press

9780120147502

9780080577746

318

229 X 152

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Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Martin Berz

Affiliations and Expertise

Michigan State University, East Lansing, U.S.A.

Kyoko Makino

Affiliations and Expertise

Michigan State University, East Lansing, U.S.A.

Khodr Shamseddine

Affiliations and Expertise

Michigan State University, East Lansing, U.S.A.

Weishi Wan

Affiliations and Expertise

Michigan State University, East Lansing, U.S.A.

Modern Map Methods in Particle Beam Physics, 1st Edition

Dynamics. Beams and Beam Physics. Differential Equations, Determinism, and Maps. Lagrangian Systems. Hamiltonian Systems. Electrodynamics. Differential Algebraic Techniques. Function Spaces and their Algebras. Taylor Differential Algebras. Advanced Methods. Fields. Analytic Field Representation. Practical Utilization of Field Information. Maps: Calculation. The Particle Optical Equations of Motion. Equations of Motion for Other Quantities. Maps: Properties. Manipulations. Symmetries. Representations. Spectrometers. Introduction. Momentum Spectrometers. Mass Spectrometers. Reconstructive Correction of Aberrations. Aberration Correction via Repetitive Symmetry. Repetitive Systems. Linear Theory. Parameter Dependent Linear Theory. Normal Forms. Syplectic Tracking.

Quotes and reviews

@from:Praise for the Series
@qu:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
@source:--MRS BULLETIN
@qu:"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
@source:--J.A. Chapman in LABORATORY PRACTICE
 
 
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