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Principles of Semiconductor Network Testing
- 1st Edition - June 5, 1995
- Author: Amir Afshar
- Language: English
- Hardback ISBN:9 7 8 - 0 - 7 5 0 6 - 9 4 7 2 - 8
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 5 3 9 5 6 - 0
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help… Read more
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Request a sales quotePrinciples of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
- Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
- Best new source of information for experienced semiconductor engineers as well as entry-level personnel
- Eight chapters about semiconductor testing
Semiconductor design and test engineers
Diode and transistor operationIntegrated circuit test basicsDigital logic testNoise identificationOperational amplifier general informationData acquisition devicesDigital signal processingCODEC (Coder/Decoder)
- No. of pages: 350
- Language: English
- Edition: 1
- Published: June 5, 1995
- Imprint: Newnes
- Hardback ISBN: 9780750694728
- eBook ISBN: 9780080539560
AA
Amir Afshar
Affiliations and expertise
National SemiconductorRead Principles of Semiconductor Network Testing on ScienceDirect