Save up to 30% on Elsevier print and eBooks with free shipping. No promo code needed.
Save up to 30% on print and eBooks.
Advances in Imaging and Electron Physics
1st Edition, Volume 109 - September 17, 1999
Editors: Benjamin Kazan, Peter W. Hawkes, Tom Mulvey
Language: English
Hardback ISBN:9780120147519
9 7 8 - 0 - 1 2 - 0 1 4 7 5 1 - 9
eBook ISBN:9780080577753
9 7 8 - 0 - 0 8 - 0 5 7 7 7 5 - 3
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Micr…Read more
Purchase options
LIMITED OFFER
Save 50% on book bundles
Immediately download your ebook while waiting for your print delivery. No promo code is needed.
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Preface
Forthcoming Contributions
Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques
I INTRODUCTION
II REVIEW OF THE DEEP-LEVEL TRANSIENT SPECTROSCOPY METHOD
III AVERAGING AND RECORDING OF DIGITAL DLTS TRANSIENT SIGNALS
IV FEEDBACK CIRCUITS AND EXPERIMENTAL SETUP FOR CC-DLTS AND CR-DLTS
V Constant-Resistance DLTS in Enhancement Mode Mosfets
VI CONSTANT-RHSISTANCE DLTS IN DEPLETION MODE MOSFETS
VII CONSTANT-RESISTANCE DLTS IN JUNCTION FIELD-EFFECT TRANSISTORS
VIII CONCLUSIONS AND AREAS FOR FUTURE RESEARCH
ACKNOWLEDGMENTS
List of Acronyms
List of Symbols
APPENDIX A: MAGNITUDE ERRORS
APPENDIX B: TIME CONSTANT ERRORS
APPENDIX C: NOISE SOURCES AND SIGNAL-TO-NOISE RATIO IN THE DLTS TRANSIENTS
APPENDIX D: ELECTRICAL CIRCUIT OF THE PSEUDO-LOGARITHMIC GENERATOR
APPENDIX E: ELECTRICAL CIRCUIT OF THE FEEDBACK CIRCUIT
APPENDIX F: LISTING OF A TEMPLATE FOR A DLTS MEASUREMENT PROGRAM
APPENDIX G: LISTING OF A TEMPLATE FOR A DLTS ANALYSIS PROGRAM
APPENDIX H: RADIATION-INDUCED DEFECTS IN SILICON
Complex Dyadic Multiresolution Analyses
ABSTRACT
I INTRODUCTION
II THE SPLINE EXAMPLE
III MULTIRESOLUTION AND WAVELET
IV DAUBECHIES’ WAVELETS
V SYMMETRIC DAUBECHIES WAVELETS
VI THE PHASE OF SDW SCALING FUNCTION
VII THE MALLAT ALGORITHM WITH COMPLEX FILTERS
VIII RESTORATION FROM THE PHASE
IX IMAGE ENHANCEMENT
X COMPLEX SHRINKAGE
XI CONCLUSION
ACKNOWLEDGMENTS
Lattice Vector Quantization for Wavelet-Based Image Coding
I INTRODUCTION
II QUANTIZATION OF WAVKLET COEFFICIENTS
III LATTICE QUANTIZATION FUNDAMENTALS
IV LATTICES
V QUANTIZATION ALGORITHMS FOR SELECTED LATTICES
VI COUNTING THE LATTICE POINTS
VII SCALING ALGORITHM
VIII SELECTING A LATTICE FOR QUANTIZATION
IX ENTROPY CODING OF LATTICE VECTORS
X EXPERIMENTAL RESULTS
XI CONCLUSIONS
APPENDIX A: CARTAN MATRICES OF SOME ROOT SYSTEMS
Fuzzy Cellular Neural Networks and Their Applications to Image Processing
I INTRODUCTION
II FUZZY CELLULAR NEURAL NETWORKS
III THEORY OF FUZZY CELLULAR NEURAL NETWORKS
IV FCNN AS COMPUTATIONAL ARRAYS
V EMBED LINGUISTIC STATEMENTS INTO FCNN
VI. LEARNING ALGORITHMS OF FCNN
VII GENERIC ALGORITHM FOR FCNN
VIII APPLICATIONS OR DISCRETE-TIME FCNN
IX CONCLUSIONS AND FUTURE WORK
Index
No. of pages: 453
Language: English
Edition: 1
Volume: 109
Published: September 17, 1999
Imprint: Academic Press
Hardback ISBN: 9780120147519
eBook ISBN: 9780080577753
BK
Benjamin Kazan
Affiliations and expertise
Xerox Corporation, Palo Alto, California, U.S.A.
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
TM
Tom Mulvey
Affiliations and expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Read Advances in Imaging and Electron Physics on ScienceDirect