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Advances in Imaging and Electron Physics
1st Edition, Volume 127 - July 31, 2003
Editor: Peter W. Hawkes
Language: English
Hardback ISBN:9780120147694
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eBook ISBN:9780080490076
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The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volu…Read more
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The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
Provides a comprehensive overview of international congress proceedings and associated publications, as source material
Researchers, academics, physicists and engineers working in the field of image and electron physics
Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.
No. of pages: 407
Language: English
Edition: 1
Volume: 127
Published: July 31, 2003
Imprint: Academic Press
Hardback ISBN: 9780120147694
eBook ISBN: 9780080490076
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
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