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Reliability Characterisation of Electrical and Electronic Systems
1st Edition - December 24, 2014
Language: English
eBook ISBN:9781782422259
9 7 8 - 1 - 7 8 2 4 2 - 2 2 5 - 9
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, ch…Read more
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This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.
The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.
Takes a holistic approach to reliability engineering
Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability
Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation
Academics and postgraduate students in electrical and electronic engineering; reliability and testing engineers; electronic product manufacturers; and those working in the following areas: nanotechnology, MEMS, integrated circuits, discrete electronic components, power electronics, modular electronics, electronic medical devices, high-temperature electronics, automotive electronic systems, electronics in aviation, solar power generation systems, power grids.
List of contributors
Woodhead Publishing Series in Electronic and Optical Materials
Foreword
1: Introduction
Abstract
1.1 Introduction
1.2 The focus of the book
1.3 Reliability science and engineering fundamentals (Chapters 2–4)
1.4 Reliability methods in component and system development (Chapters 5–9)
1.5 Reliability modelling and testing in specific applications (Chapters 10 and 11)
1.6 Conclusion
2: Reliability and stupidity: mistakes in reliability engineering and how to avoid them
Abstract
2.1 Introduction
2.2 Common mistakes in reliability engineering
2.3 Conclusion
3: Physics-of-failure (PoF) methodology for electronic reliability
Abstract
3.1 Introduction
3.2 Reliability
3.3 PoF models
3.4 PoF reliability assessment
3.5 Applications of PoF to ensure reliability
3.6 Summary and areas of future interest
4: Modern instruments for characterizing degradation in electrical and electronic equipment
Abstract
4.1 Introduction
4.2 Destructive techniques
4.3 Nondestructive techniques
4.4 In situ measurement techniques
4.5 Conclusions
5: Reliability building of discrete electronic components
Abstract
5.1 Introduction
5.2 Reliability building
5.3 Failure risks and possible corrective actions
5.4 Effect of electrostatic discharge on discrete electronic components
5.5 Conclusions
6: Reliability of optoelectronics
Abstract
6.1 Introduction
6.2 Overview of optoelectronics reliability
6.3 Approaches and recent developments
6.4 Case study: reliability of buried heterostructure (BH) InP semiconductor lasers
6.5 Reliability extrapolation and modeling
6.6 Electrostatic discharge (ESD) and electrical overstress (EOS)