Darsen Duane Lu

Darsen Duane Lu

Darsen Lu was one of the key contributors of the industry standard FinFET compact model, BSIM-CMG, and thin-body SOI compact model, BSIM-IMG. He received the B.S. degree in electrical engineering in 2005, from National Tsing Hua University, Hsinchu, Taiwan, and the M.S. and Ph.D. degrees in electrical engineering from the University of California, Berkeley, in 2007 and 2011. Since 2011, he has been a Research Scientist with the IBM Thomas J. Watson Research Center, Yorktown Heights, NY. His current research focuses on the modeling of novel semiconductor devices such as SiGe FinFETs, phase change memory and carbon-based transistors.

Affiliations and Expertise

Research Scientist, IBM Research.