Benjamin K. Tsai

Benjamin K. Tsai

Benjamin K. Tsai graduated from Brigham Young University with a BSME degree in 1987. Next, he obtained a MSME degree in 1990 at Purdue University by completing his thesis on “Dual-wavelength Radiation Thermometry: Emissivity Compensation Algorithms.” In 1993 he finished a PhD degree at Purdue University with a dissertation entitled, “Macroscopic Spread Function Analysis for Subsurface Scattering in Semitransparent Materials.” Since that time, he has worked in the Sensor Science Division at the National Institute of Standards and Technology. His interests and projects have included development of a new irradiance scale, developing the ambient background infrared calibration laboratory, setting up high heat flux calibrations, making accurate temperature measurements in rapid thermal processing, modeling diffraction effects, performing low-temperature radiance temperature and spectrophotometric calibrations, evaluating skin reflectance, understanding ageing effects in ceramics, setting up a synchrotron beamline, and improving spectrophotometry in the SWIR using extend InGaAs detectors.

Affiliations and Expertise

NIST, Gaithersburg, MD, USA